Thermodynamic Properties of Free Standing Thin Metal films Investigated Using Statistical Moment Method: Temperature and Pressure Dependence

Vu Van Hung, Duong Dai Phuong, Nguyen Thi Hoa
Author affiliations

Authors

  • Vu Van Hung Vietnam Education Publishing House
  • Duong Dai Phuong Tank Armour Officers Training School, Tam Duong, Vinh Phuc
  • Nguyen Thi Hoa Fundamental Science Faculty, University of Transport and Communications

DOI:

https://doi.org/10.15625/0868-3166/24/2/3731

Keywords:

moment method, thermodynamic properties, high pressure, equation of state, thin film

Abstract

The moment method in statistical dynamics \textit{(SMM)} is used to study thermodynamic properties of free standing thin metal films with face-centered cubic structure (fcc) taking into account the anharmonicity effects of the lattice vibrations and hydrostatic pressures. The explicit expressions of the lattice constant, thermal expansion coefficient, and specific heats at the constant volume and those at the constant pressure, \(C_V\) and \(C_P\)  of the metal thin films are derived in closed analytic forms in terms of the power moments of the atomic displacements. The thermodynamic quantities of Au, Ag, Cu and Al metal thin films are calculated as a function of the temperature and pressure, and they are in good agreement with the corresponding results obtained from other theoretical calculations and experimental values. The effective pair potentials work well for the calculations of fcc metal thin films.

Downloads

Download data is not yet available.

Metrics

Metrics Loading ...

References

L. H. Liang. and B. Li, Physical Review B, 73 (15) (2006), 153303 DOI: https://doi.org/10.1103/PhysRevB.73.153303

Z. Kolska et al., Materials Letters, Materials Letters, 64 (2010), 1160-1162 DOI: https://doi.org/10.1016/j.matlet.2010.02.038

H. Kahn et al., J. Mater. Res., 17 (7) (2002), 1855-1862 DOI: https://doi.org/10.1557/JMR.2002.0274

Z. Mei-Qiong et al., Chin. Phys. Lett., 25 (2) (2008), 563 DOI: https://doi.org/10.1088/0256-307X/25/2/057

F. S. Tehrani et al., J. Mater Sci: Mater Electron, (2012), doi 10.1007/s10854-012-0934-z

Feng Gao et al., Tribol Lett., 31 (2008), 99–106, doi 10.1007/11249-008-9342-1 DOI: https://doi.org/10.1007/s11249-008-9342-1

Can Wang et al., Thin Solid Films 485 (2005), 82– 89 DOI: https://doi.org/10.1016/j.tsf.2005.03.055

J.A. Pérez et al., J. Phys.: Conf. Ser., 274 (1) (2011), 012119 doi:10.1088/1742-6596/274/1/012119 DOI: https://doi.org/10.1088/1742-6596/274/1/012119

Ju-Hyung Kim et al., Organic Electronics, 11 (2010), 964–968 DOI: https://doi.org/10.1016/j.orgel.2010.02.015

C. R. Cho et al., Cryst. Res. Technol., 30 (6) (1995), 873-880 DOI: https://doi.org/10.1002/crat.2170300627

K. S. Rothenberger et al., Jour. Memb. Sci., 244 (1–2) (2004), 55–68 DOI: https://doi.org/10.1016/j.memsci.2004.06.036

N. Tang and V. V. Hung: Phys. Status Solidi B, 149 (1988), 511 DOI: https://doi.org/10.1002/pssb.2221490212

N. Tang and V. V. Hung: Phys. Status Solidi B, 161 (1990), 165 DOI: https://doi.org/10.1002/pssb.2221610115

V. V. Hung and N. T. Hai: Int. J. Mod. Phys. B, 12 (1998) 191 DOI: https://doi.org/10.1142/S0217979298000144

V. V. Hung, D. D. Phuong and N. T. Hoa, Com. Phys., 23 (4) (2013), 301–311 DOI: https://doi.org/10.15625/0868-3166/23/4/3351

R. B. Capaz, G. C. de AraD újo, B. Koiller and J. P. von der Weid: J. Appl. Phys., 74 (1993), 5531 DOI: https://doi.org/10.1063/1.354211

M. N. Mazomedov, J. Fiz. Khimic, 61 (1987), 1003 DOI: https://doi.org/10.2466/pr0.1987.61.3.1003

Madan Singh et al., Nanoscience and Nanotechnology, 2 (6) (2012), 20–207

Madan Singh, Moruti Kao., Advances in Nanoparticles, 2 (2013), 350–357 DOI: https://doi.org/10.4236/anp.2013.24048

R Kumar and Munish Kumar., Indian Journal of Pure and Appl. Phys., 51 (2013), 87–93

V. V. Hung and N. T. Hoa: AJSTD Issues 23 (1-2) (2006), 27-42 DOI: https://doi.org/10.29037/ajstd.86

O. Kraft and W. D. Nix., Journal of Appl. Phys., 83 (1998), 3035-3038 DOI: https://doi.org/10.1063/1.367118

R.O. Simmons and R.W. Balluffi, Phys. Rev., 117 (1960), 52 DOI: https://doi.org/10.1103/PhysRev.117.52

N. T. Hoa, Doctor of Philosophy Thesis, HNUE., (2007)

Downloads

Published

22-07-2014

How to Cite

[1]
V. V. Hung, D. D. Phuong, and N. T. Hoa, “Thermodynamic Properties of Free Standing Thin Metal films Investigated Using Statistical Moment Method: Temperature and Pressure Dependence”, Comm. Phys., vol. 24, no. 2, p. 177, Jul. 2014.

Issue

Section

Papers
Received 06-03-2014
Accepted 06-05-2014
Published 22-07-2014

Most read articles by the same author(s)

1 2 > >>