The Temperature-sensitivity of a Critical Electric Field Induced Magnetic Easy-axis Reorientation Ferromagnetic/ferroelectric Layered Heterostructures
- magnetoelectric effect,
- multiferroic materials,
- magnetic reorientation
How to Cite
Hong, N. T. M., Thang, P. D., Long, D. D., Ha, P. T., Trung, N. N., Cong, P. H., & Duc, N. D. (2014). The Temperature-sensitivity of a Critical Electric Field Induced Magnetic Easy-axis Reorientation Ferromagnetic/ferroelectric Layered Heterostructures. Communications in Physics, 24(3S1), 71–79. https://doi.org/10.15625/0868-3166/24/3S1/5222
AbstractWe have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.
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