Vol. 24 No. 3S1 (2014)
Papers

The Temperature-sensitivity of a Critical Electric Field Induced Magnetic Easy-axis Reorientation Ferromagnetic/ferroelectric Layered Heterostructures

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  • Nguyen Thi Minh Hong,
  • Pham Duc Thang,
  • Dang Dinh Long,
  • Pham Thai Ha,
  • Nguyen Ngoc Trung,
  • Pham Hong Cong,
  • Nguyen Dinh Duc
Nguyen Thi Minh Hong
Laboratory for Micro and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
Pham Duc Thang
Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
Dang Dinh Long
Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
Pham Thai Ha
Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
Nguyen Ngoc Trung
Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
Pham Hong Cong
Faculty of Engineering Mechanics and Automation, University of Engineering and Technology, Vietnam National University, Hanoi
Nguyen Dinh Duc
Faculty of Engineering Mechanics and Automation, University of Engineering and Technology, Vietnam National University, Hanoi
DOI: https://doi.org/10.15625/0868-3166/24/3S1/5222

Published 07-11-2014

Keywords

  • magnetoelectric effect,
  • multiferroic materials,
  • magnetic reorientation

How to Cite

Hong, N. T. M., Thang, P. D., Long, D. D., Ha, P. T., Trung, N. N., Cong, P. H., & Duc, N. D. (2014). The Temperature-sensitivity of a Critical Electric Field Induced Magnetic Easy-axis Reorientation Ferromagnetic/ferroelectric Layered Heterostructures. Communications in Physics, 24(3S1), 71–79. https://doi.org/10.15625/0868-3166/24/3S1/5222
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Abstract

We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.
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