The Temperature-sensitivity of a Critical Electric Field Induced Magnetic Easy-axis Reorientation Ferromagnetic/ferroelectric Layered Heterostructures

Authors

  • Nguyen Thi Minh Hong Laboratory for Micro and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
  • Pham Duc Thang Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
  • Dang Dinh Long Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
  • Pham Thai Ha Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
  • Nguyen Ngoc Trung Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
  • Pham Hong Cong Faculty of Engineering Mechanics and Automation, University of Engineering and Technology, Vietnam National University, Hanoi
  • Nguyen Dinh Duc Faculty of Engineering Mechanics and Automation, University of Engineering and Technology, Vietnam National University, Hanoi

DOI:

https://doi.org/10.15625/0868-3166/24/3S1/5222

Keywords:

magnetoelectric effect, multiferroic materials, magnetic reorientation

Abstract

We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.

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Published

07-11-2014

How to Cite

Hong, N. T. M., Thang, P. D., Long, D. D., Ha, P. T., Trung, N. N., Cong, P. H., & Duc, N. D. (2014). The Temperature-sensitivity of a Critical Electric Field Induced Magnetic Easy-axis Reorientation Ferromagnetic/ferroelectric Layered Heterostructures. Communications in Physics, 24(3S1), 71–79. https://doi.org/10.15625/0868-3166/24/3S1/5222

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Section

Papers