The Temperature-sensitivity of a Critical Electric Field Induced  Magnetic Easy-axis Reorientation Ferromagnetic/ferroelectric Layered  Heterostructures

Nguyen Thi Minh Hong; Pham Duc Thang; Dang Dinh Long; Pham Thai Ha; Nguyen Ngoc Trung; Pham Hong Cong; Nguyen Dinh Duc

doi:10.15625/0868-3166/24/3S1/5222

The Temperature-sensitivity of a Critical Electric Field Induced Magnetic Easy-axis Reorientation Ferromagnetic/ferroelectric Layered Heterostructures

Nguyen Thi Minh Hong, Pham Duc Thang, Dang Dinh Long, Pham Thai Ha, Nguyen Ngoc Trung, Pham Hong Cong, Nguyen Dinh Duc

Author affiliations

Authors

Nguyen Thi Minh Hong Laboratory for Micro and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
Pham Duc Thang Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
Dang Dinh Long Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
Pham Thai Ha Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
Nguyen Ngoc Trung Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
Pham Hong Cong Faculty of Engineering Mechanics and Automation, University of Engineering and Technology, Vietnam National University, Hanoi
Nguyen Dinh Duc Faculty of Engineering Mechanics and Automation, University of Engineering and Technology, Vietnam National University, Hanoi

DOI:

https://doi.org/10.15625/0868-3166/24/3S1/5222

Keywords:

magnetoelectric effect, multiferroic materials, magnetic reorientation

Abstract

We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.

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Published

07-11-2014

How to Cite

[1]

N. T. M. Hong, “The Temperature-sensitivity of a Critical Electric Field Induced Magnetic Easy-axis Reorientation Ferromagnetic/ferroelectric Layered Heterostructures”, Comm. Phys., vol. 24, no. 3S1, pp. 71–79, Nov. 2014.

IEEE

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Issue

Vol. 24 No. 3S1 (2014)

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Papers

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