Application of Path-integral for Studying EXAFS Cumulants

Ho Khac Hieu; Nguyen Manh Hai

doi:10.15625/0868-3166/24/3S1/5075

Application of Path-integral for Studying EXAFS Cumulants

Ho Khac Hieu, Nguyen Manh Hai

Author affiliations

Authors

Ho Khac Hieu Communications in Physics, VAST
Nguyen Manh Hai Hanoi University of Science, Vietnam National University, Hanoi

DOI:

https://doi.org/10.15625/0868-3166/24/3S1/5075

Keywords:

EXAFS cumulants, path-integral, effective potential

Abstract

In this work, the path-integral effective potential (PIEP) method has been applied to re-study the temperature dependence of extended X-ray absorption fine structure (EXAFS) cumulants of materials. Using the trial density matrix and effective potential expression, we derived the analytical expressions of the first three EXAFS cumulants in the first shell of materials. The cumulant relation is also calculated to determine the temperature range in which the PIEP method could be applied. Our results are compared with available experimental data as well as with those calculated by the first-order perturbation approach in anharmonic Einstein model and the reasonable agreements are achieved.

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Published

28-10-2014

How to Cite

[1]

H. K. Hieu and N. M. Hai, “Application of Path-integral for Studying EXAFS Cumulants”, Comm. Phys., vol. 24, no. 3S1, pp. 40–44, Oct. 2014.

IEEE

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Issue

Vol. 24 No. 3S1 (2014)

Section

Papers

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