Chien, Nguyen Dang, et al. “Roles of Gate-Oxide Thickness Reduction in Scaling Bulk and Thin-Body Tunnel Field-Effect Transistors”. <i>Vietnam Journal of Science and Technology</i>, vol. 55, no. 3, June 2017, pp. 316-23, doi:10.15625/2525-2518/55/3/8362.