Chien, Nguyen Dang, Dao Thi Kim Anh, and Chun-Hsing Shih. 2017. “Roles of Gate-Oxide Thickness Reduction in Scaling Bulk and Thin-Body Tunnel Field-Effect Transistors”. <i>Vietnam Journal of Science and Technology</i> 55 (3). Hanoi, VN:316-23. https://doi.org/10.15625/2525-2518/55/3/8362.