VO, Hieu Dinh; NGUYEN, Thu-Trang. CLUE: A clustering-based test reduction approach for software product lines. <b>Journal of Computer Science and Cybernetics</b>, <i>[S. l.]</i>, v. 40, n. 2, p. 165–185, 2024. DOI: 10.15625/1813-9663/19694. Disponível em: https://vjs.ac.vn/jcc/article/view/19694. Acesso em: 5 dec. 2025.