Vo, Hieu Dinh, and Thu-Trang Nguyen. “CLUE: A CLUSTERING-BASED TEST REDUCTION APPROACH FOR SOFTWARE PRODUCT LINES”. Journal of Computer Science and Cybernetics 40, no. 2 (May 20, 2024): 165–185. Accessed June 30, 2024. https://vjs.ac.vn/index.php/jcc/article/view/19694.