VO, H. D.; NGUYEN, T.-T. CLUE: A CLUSTERING-BASED TEST REDUCTION APPROACH FOR SOFTWARE PRODUCT LINES. Journal of Computer Science and Cybernetics, [S. l.], v. 40, n. 2, p. 165–185, 2024. DOI: 10.15625/1813-9663/19694. Disponível em: https://vjs.ac.vn/index.php/jcc/article/view/19694. Acesso em: 30 jun. 2024.