1.
Hieu HK, Hung VV, Hung NV. Investigation of the EXAFS Cumulants of Silicon and Germanium Semiconductors by Statistical Moment Method: Pressure Dependence. Comm. Phys. [Internet]. 2011 Sep. 19 [cited 2024 Mar. 28];21(3):245. Available from: https://vjs.ac.vn/index.php/cip/article/view/174