Hieu, Ho Khac, Vu Van Hung, and Nguyen Van Hung. “Investigation of the EXAFS Cumulants of Silicon and Germanium Semiconductors by Statistical Moment Method: Pressure Dependence”. Communications in Physics 21, no. 3 (September 19, 2011): 245. Accessed August 3, 2021. https://vjs.ac.vn/index.php/cip/article/view/174.