Hieu, H. K., V. V. Hung, and N. V. Hung. “Investigation of the EXAFS Cumulants of Silicon and Germanium Semiconductors by Statistical Moment Method: Pressure Dependence”. Communications in Physics, vol. 21, no. 3, Sept. 2011, p. 245, doi:10.15625/0868-3166/21/3/174.