L. H. Khiem, N. T. Nghia, V. H. Phong, and B. V. Loat, “Proton Induced X-Ray Emission (PIXE) Analysis on Thick Samples at HUS 5SDH-2 Tandem Accelerator System”, Comm. Phys., vol. 24, no. 3S2, pp. 1–7, Sep. 2014.