HUNG, V. V.; HIEU, H. K. Study the Temperature Dependence of EXAFS Cumulants of Si and Ge by the Anharmonic Correlated Einstein Model. Communications in Physics, [S. l.], v. 21, n. 1, p. 25, 2011. DOI: 10.15625/0868-3166/21/1/88. Disponível em: https://vjs.ac.vn/index.php/cip/article/view/88. Acesso em: 26 apr. 2024.