KHIEM, L. H.; NGHIA, N. T.; PHONG, V. H.; LOAT, B. V. Proton Induced X-Ray Emission (PIXE) Analysis on Thick Samples at HUS 5SDH-2 Tandem Accelerator System. Communications in Physics, [S. l.], v. 24, n. 3S2, p. 1–7, 2014. DOI: 10.15625/0868-3166/24/3S2/5013. Disponível em: https://vjs.ac.vn/index.php/cip/article/view/5013. Acesso em: 21 oct. 2021.