TIEP, N. V.; KHIEM, L. H.; SOHATSKY, A. S.; SKURATOV, V. A.; VAN VUUREN, A. J.; O’CONNELL, J. H.; ZDOROVETS, M. TEM Study of ODS Alloy Doped with Helium Ions and Re-irradiated with Swift Xe Ions. Communications in Physics, [S. l.], v. 29, n. 3SI, p. 377, 2019. DOI: 10.15625/0868-3166/29/3SI/14286. Disponível em: https://vjs.ac.vn/index.php/cip/article/view/14286. Acesso em: 25 apr. 2024.