HUNG, Vu Van; HIEU, Ho Khac. Study the Temperature Dependence of EXAFS Cumulants of Si and Ge by the Anharmonic Correlated Einstein Model. <b>Communications in Physics</b>, <i>[S. l.]</i>, v. 21, n. 1, p. 25, 2011. DOI: 10.15625/0868-3166/21/1/88. Disponível em: https://vjs.ac.vn/cip/article/view/88. Acesso em: 2 jan. 2026.