KHIEM, Le Hong; NGHIA, Nguyen The; PHONG, Vi Ho; LOAT, Bui Van. Proton Induced X-Ray Emission (PIXE) Analysis on Thick Samples at HUS 5SDH-2 Tandem Accelerator System. <b>Communications in Physics</b>, <i>[S. l.]</i>, v. 24, n. 3S2, p. 1–7, 2014. DOI: 10.15625/0868-3166/24/3S2/5013. Disponível em: https://vjs.ac.vn/cip/article/view/5013. Acesso em: 2 jan. 2026.