The Temperature-sensitivity of a Critical Electric Field Induced Magnetic Easy-axis Reorientation Ferromagnetic/ferroelectric Layered Heterostructures

Nguyen Thi Minh Hong, Pham Duc Thang, Dang Dinh Long, Pham Thai Ha, Nguyen Ngoc Trung, Pham Hong Cong, Nguyen Dinh Duc


We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.


magnetoelectric effect, multiferroic materials, magnetic reorientation

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